ACCRETECH
-Wafer Dicing, Wafer Grinding, Wafer Inspection, Wafer Manufacturing, Probing Systems
APPLIED TEST SYSTEMS
-Automated IC Testing Equipment
CREDENCE
-Automated IC Testing Equipment
EPM TEST INC
-Memory Test System
FEI
-Electron Microscopes, FIB Beam, Dual Beam
GAVISH
-Sapphire Products
GUIDETECH
-Continuous Time Interval Analysers
HITACHI KOKUSAI ELECTRIC
-Photoresist Stripping System
IDC
-Person Guided Vehicle (PGV)
ISIS SENTRONICS
-Wafer Inspection System
LIGHT WIND
-Process Control Monitoring
LTX
-Automated IC Testing Equipment
MICRONICS
-Automatic Wafer Probes, Manual Wafer Probes, Semi-Auto Wafer Probes, Test Sockets
MITSUBISHI MATERIALS CORP
-Dicing Materials
NIPPON SCIENTIFIC CO
-RIE System, Plastic Decapsulation System, Curve Tracer